Trojan MR-43M Research-Grade Brightfield/Darkfield Metallurgical Microscope

Features

The stand adopts the principle of a T-shaped roof-frame structure, with a bold cylindrical design on the bottom side serving as the main load-bearing and lateral-force-resisting component. It bears large vertical and horizontal loads and greatly reduces the instability caused by external impact. A newly designed lamp housing is embedded in the recessed area at the back, cleverly creating a spread-wing shape full of imagination and visual appeal. The whole instrument is finished with a special powder-coating process that combines protection, decoration, wear resistance, and solvent resistance.

• T-shaped roof-frame structure with high rigidity and high stability;
• Building-block detachable structure, flexible and versatile;
• Special surface treatment process, both attractive and practical;
• Optimized and upgraded light-source condenser system, energy-saving and environmentally friendly.

Product Advantages

• Intelligent encoded microscope. The MR-43M encoded microscope integrates the microscope hardware settings with Trojan image analysis software. The objective magnification is displayed on screen, and the calibration values recorded in the software are adjusted automatically when the magnification is switched, eliminating measurement errors caused by forgetting to switch the software magnification.
• Intelligent light intensity management with consistent illumination. During initial setup, the illumination intensity can be adjusted to match the specific hardware configuration of the encoded objective nosepiece; when the magnification is changed, the microscope automatically adjusts the light intensity to the correct value. The brightness memory function stores the illumination brightness used with each objective and adjusts the light intensity automatically when switching between objectives, reducing visual fatigue and improving work efficiency.
• Centerable objective turret. The objective center is adjustable. Designed with precision bearings, the turret turns with a light, smooth feel, offers high repeat positioning accuracy, and delivers zero eccentricity after objective changeover.
• Rich observation methods to meet your inspection needs. It integrates brightfield, darkfield, polarized light, DIC differential interference contrast, and other observation functions; functions can be selected according to the actual application.
• Wide-beam imaging system design. Ultra-wide field-of-view observation brings you a brand-new large-field experience.
• Excellent polarizing system. The polarizing system includes a polarizer insert and an analyzer insert for polarized-light inspection. In semiconductor and PCB inspection it eliminates stray light for clearer detail. The 360° rotatable analyzer allows convenient observation of how the specimen appears under light at different polarization angles without moving the specimen.
• Differential interference contrast (DIC) imaging system. It converts minute height differences that cannot be detected under brightfield observation into high-contrast light/dark differences presented as a three-dimensional relief image, for example LCD conductive particles, scratches on precision disk surfaces, and so on.
• Excellent ergonomic design. The low-position focusing mechanism is comfortable to operate and is equipped with a coarse/fine tension-adjustment device, an upper-limit stop for coarse focusing, and a random-limit stop. The random-limit stop allows rapid specimen replacement and protects both the specimen and the objectives.

Technical Specifications